For more information about item submission and attendance, see About the Technical Calendar.
Friday, May 24
Three Cs of Advanced Iris Biometrics:
Patrick Flynn, University of Notre Dame, South Bend, Indiana
Crypts, Cosmetics, and Contact Lenses
Measurement Science and Systems Engineering Division Lecture Series
10:30 AM — 11:30 AM, Engineering Technology Facility (Building 5800), Room F-202
Contact: Chris Boehnen (email@example.com), 865.241.8834
AbstractAs iris recognition products continue to enter the market and the research area matures, efforts to broaden the scope and capability of iris recognition are emerging. Research on recognition from less constrained data with a wider diversity of subject attributes has created fertile ground for topical studies. In this presentation, we will motivate and discuss new work on:
1. Iris identification using crypt and anticrypt features that can be annotated by humans and therefore are of potential use in a forensic investigation context with humans in the loop.
2. Classification of ocular images with respect to the presence or absence of contact lenses.
3. Performance of iris recognition systems in the presence or absence of mascara.
About the Speaker
Patrick J. Flynn is Professor of Computer Science & Engineering and Concurrent Professor of Electrical Engineering at the University of Notre Dame. He received the B.S. in Electrical Engineering (1985), the M.S. in Computer Science (1986), and the Ph.D. in Computer Science (1990) from Michigan State University, East Lansing. His research interests include computer vision, biometrics, and image processing. Dr. Flynn is an IEEE Fellow, an IAPR Fellow, and an ACM Distinguished Scientist. He has received outstanding teaching awards from Washington State University and the University of Notre Dame.