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Wednesday, May 01

3D Mapping of Defects and Strain Gradients near Buried Interfaces at Mesoscale

Rosa Barabash, Materials Science and Technology Div., Oak Ridge National Laboratory, Oak Ridge, TN
Materials Science and Technology and Chemical Sciences Divisions Seminar Series
10:00 AM — 11:00 AM, Weinberg Auditorium, Building 4500-N
Contact: Olga Ovchinnikova (ovchinnikovo@ornl.gov), 865.574.4871

Abstract

Interfaces play a crucial role in the two- phase and multi- phase materials properties. Strain partitioning through the interfaces determines materials response to external fields. Recently developed Polychromatic X-ray Microdiffraction together with Differential Aperture X-ray Microscopy was used to characterize the 3D distribution of strain and dislocation density near buried interfaces in layered and fibrous materials under external fields. It is shown that two-phase materials response to indentation and tension is distinct from the single phase materials. Depth-dependent opposite sign strains are directly measured in individual layers/fibers of the materials. Research supported by the Division of Materials Sciences and Engineering, U.S. Department of Energy. Data collection was carried out on beamline ID-34-E at the Advanced Photon Source.