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Hitachi FB-2000A Focused Ion Beam (FIB) System

This instrument can be downloaded and is provided here in Adobe PDF formats.

 

 

Techniques/Capabilities:

  • W-deposition/liquid Ga ion source
  • Micromachining/Patterning
  • Site-specific lift-out of specimens for
    TEM preparation

Current Research Activities:

  • Oxide Scales on Metallic Alloys
  • Coated Ceramic Fibers
  • Superconductors/Buffer Layers
  • Thermal Barrier Coatings

Contact: Dorothy Coffey, coffeydw@ornl.gov, (865) 576-7688

 


 Oak Ridge National Laboratory