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JEOL 2200FS Aberration-Corrected STEM

This instrument can be downloaded and is provided here in Adobe PDF formats.

Techniques/Capabilities:

  • Aberration-corrected electron probe <100pm high angle annular dark field (HAADF) imaging
  • Simultaneous BF/DF-STEM
  • Atomic column resolution EELS
  • STEM EELS spectrum imaging
  • EFTEM spectrum imaging
  • Remote access/operation

Current Research Activities:

  • Bimetallic catalyst characterization
  • Ex-situ studies of catalyst nanostructure evolution
  • High resolution Z-contrast imaging of complex oxides
 

Contact: Larry Allard, allardlfjr@ornl.gov, (865) 574-4981

 


 Oak Ridge National Laboratory