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PHI 680 Scanning Auger Nanoprobe

This instrument can be downloaded and is provided here in Adobe PDF formats.

 

 

Techniques/Capabilities:

  • Provides elemental and some chemical information
  • Surface sensitive (top 3-5 nm)
  • High spatial resolution
  • Ar+-ion depth profiling
  • In-situ fracture stage

Current Research Activities:

  • Grain boundary characterization of metals and alloys
  • 3-D thin film characterization using elemental mapping and depth profiling
  • Corrosion and failure analysis

Contact: Harry M. Meyer, meyerhmiii@ornl.gov (865) 574-5092

 

 

 


 Oak Ridge National Laboratory