Staff Only

Welcome to the X-ray Scattering & Microscopy Group Group

The mission of the X-ray Scattering and Micrsocopy group is to understand the fundamental electronic, atomic, and mesoscale basis for materials properties and dynamics.  We use advanced x-rays sources and perform state-of-the-art x-ray scattering and microscopy investigations in conjunction with collaborative, first-principles theory and modeling analyses. We also pioneer innovative investigative tools and techniques, which include recent advances in neutron optics and techniques that borrow from our x-ray expertise. Ongoing research includes three-dimensional (3D), submicron-resolution x-ray microscopy studies of the microstructure and evolution of materials on mesoscopic length scales (tenths-to-hundreds of microns); inelastic x-ray scattering studies of correlated electron materials; and elastic diffuse scattering probes of local atomic ordering. Group scientists provide new information about the structure of samples of programmatic interest to the Materials Science and Technology Division/ ORNL scientists and collaborators. The unique characterization tools and techniques of the X-ray Scattering and Microscopy Group have led to close collaborations with scientists throughout the U.S. and around the world.

The principal technical contact for discussing potential projects in the X-ray Scattering and Microscopy Group is Dr. John D. Budai, Group Leader; tel. (865) 574-7659, e-mail


 Oak Ridge National Laboratory