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Fig. 10.  Polychromatic x-ray microbeam spot produced with a differentially profiled x-ray mirror.

Group scientist and collaborators have pioneered many new x-ray techniques. These include advanced x-ray focusing optics, resonant x-ray diffraction, novel diffuse scattering, time-resolved x-ray diffraction, inelastic x-ray scattering, in-situ pulsed laser deposition, and submicron resolved 3D polychromatic microdiffraction.

Advanced x-ray characterization supported by the group include:

  • Polychromatic microdiffraction with differential aperture microscopy
  • In-situ laser deposition diffraction
  • Anomalous diffuse x-ray scattering
  • Inelastic scattering
  • Spatially resolved neutron white-beam diffraction

Samples of the study include:

  • Fe-Ni-Cr and other intermetallic alloys
  • Manganite materials
  • High-temperature superconductors and RABiTS substrates
  • Single and polycrystals of Cu and Al
  • Advanced electronic materials
  • LED and photovoltaic materials
  • Grain boundary samples


 Oak Ridge National Laboratory